微光成像系统三维噪声测量及其分析  

The 3-D Noise Measurement and Analysis of Low-Light-Level Imaging System

作　　者：李升才[1] 金伟其[1] 张长泉[2] 

机构地区：[1]北京理工大学信息科学技术学院光电工程系,北京100081 [2]北京特种车辆研究所,北京100072

出　　处：《北京理工大学学报》2005年第5期439-442,共4页Transactions of Beijing Institute of Technology

基　　金：国家部委预研项目(441302020302)

摘　　要：为了分别从时域和空域对微光成像系统的噪声特性进行测量和分析,分别建立了微光成像系统三维噪声模型及其测量系统,并对微光ICCD成像系统和CCD成像系统的三维噪声进行了测量与分析.测量结果表明:随着ICCD像增强器光阴极面照度的提高,空间噪声、时间噪声、信号总平均值和信噪比均升高,符合微光ICCD成像系统的实际性能.通过三维噪声分析,实现了区分微光ICCD(或CCD)成像系统中由成像面缺陷和死像素点形成的两种固定图案噪声,且对光锥耦合技术进行定性的评价.In order to measure and analyze the noise performance of low-light-level imaging system separately from temporal and spatial field, 3-D noise models and their measurement system was established. The 3-D noises of both ICCD and CCD imaging system was measured by the system. Measurement results indicate that the spatial noise, temporal noise, signal average value and signal to noise ratio are increased with the increase of the cathode luminance of ICCD image intensifier, which accord with the performance of a real imaging system. The analysis of 3-D noise indicated that two kinds fixed pattern noise respectively formed by imaging plane defect and dead pixel dots were distinguished in ICCD or CCD imaging system and the qualitative evaluation was carried out to optical taper coupling technology.

关 键 词：空间噪声 时间噪声 三维噪声 信噪比 微光成像系统 

分 类 号：TN223[电子电信—物理电子学]