高可靠启动电路的分析与设计  

High Reliability Start-up Circuits Design

作　　者：庞坚[1] 吴金[2] 闫良海[1] 

机构地区：[1]东南大学微电子中心,南京210096 [2]东南大学无锡分校,江苏无锡214028

出　　处：《电子器件》2005年第2期390-393,共4页Chinese Journal of Electron Devices

基　　金：无锡市自然科学基金(CK040005)资助项目。

摘　　要：启动电路的性能对模拟电路的稳定工作有重要的影响。基于电路系统启动的基本原理,论文详细分析了电路启动的瞬态工作过程,给出了各种常用的启动电路结构。针对不同结构的特点,讨论了电路瞬态启动过程中可能出现问题,并提出了相应的解决方案。模拟结果表明,针对不同应用而设计的启动电路,均具有良好的可靠性,满足了电路稳定启动的要求。The performance of start-up circuits has a great influence on the stable operation of analog circuit. Based on the static point setting up principle of system, the transient response procedure is analyzed and several conventional start-up circuits are presented. Focused on the different structure faults, the problems that may occur in transient the power-on of system are analyzed, and the corresponding solutions are also given. The simulation results show that the proposed start-up circuits for different applications have a high reliability and satisfy the requirements of circuits to stable power-on transient.

关 键 词：启动 瞬态 可靠性 

分 类 号：TN402[电子电信—微电子学与固体电子学]