γ射线辐照LiF晶体中辐照缺陷的X射线黄昆漫散射实验测量  

X-RAY HUANG DIFFUSE SCATTERING FROM DEFECTS IN γ IRRADIATED LiF CRYSTAL

作　　者：姜晓明[1] 吴自勤[1] 钱临照 

机构地区：[1]中国科学技术大学基础物理中心

出　　处：《物理学报》1989年第4期529-533,共5页Acta Physica Sinica

基　　金：中国科学院科学基金

摘　　要：采用有前单色器的普通X射线衍射仪,分别用微分和积分方法测量了γ射线辐照LiF晶体中缺陷集团的黄昆漫散射。黄昆漫散射的分布表明,LiF晶体中辐照缺陷集团的应变场接近于各向同性。Using X-ray diffractometer equipped with a premonochromator, X-ray Huang diffuse scattering from defects in γ irradiated LiF crysial has been measured with differential and integral methods. The results show that the strain field of irradiation defects in LiF crystal is nearly isotropic.

关 键 词：LiF晶体 辐照缺陷 黄昆散射 测量 

分 类 号：O77[理学—晶体学]