电子元器件的贮存可靠性及评价技术  

Electronic Components Storage Reliability and Evaluation Technology

作　　者：杨丹[1] 恩云飞[1] 黄云[1] 

机构地区：[1]信息产业部电子第五研究所电子元器件可靠性物理及应用技术国家级重点实验室,广东广州510610

出　　处：《电子元件与材料》2005年第7期61-64,共4页Electronic Components And Materials

摘　　要：综述了国内外元器件的贮存可靠性研究现状,分析了元器件贮存失效模式及原因,表明减少元器件自身缺陷、改善固有可靠性是提高其贮存可靠性的关键。并从应用性角度出发,对现场贮存、长期自然贮存试验、极限应力、加速贮存寿命试验等贮存可靠性评价技术进行了对比分析。The research status of domestic and foreign electronic components storage reliability were reviewed. Storage failure modes and mechanisms of electronic components were discussed. Results show that defects are critical factors that influence component storage reliability. Besides, storage reliability evaluation technology such as field storage, long-term storage test, limit stress test and accelerated storage life test are compared in utility.

关 键 词：电子技术 贮存可靠性 综述 长期贮存试验 极限应力试验 加速贮存寿命试验 

分 类 号：TN601[电子电信—电路与系统]