采用单片式探测器实现辐射通量定标  

Radiation flux calibration performed by a single chip detector

作　　者：周磊[1] 章骏平[1] 郑小兵[1] 

机构地区：[1]中国科学院安徽光学精密机械研究所遥感室

出　　处：《光电工程》2005年第6期59-62,共4页Opto-Electronic Engineering

基　　金：国家自然基金资助项目(60378027)

摘　　要：在基于双单色仪的辐射通量定标中,为了克服陷阱探测器视场小、孔径小的缺点,提出了采用单片式探测器替代陷阱探测器进行辐射通量定标的方法。采用只与光路垂直的一片硅探测器,使其光敏面与孔径光阑几乎重合,以增大探测器的孔径角。同时为了保证测量精度,采用偏置电流极低的运算放大器OPA128,并且增大了反馈电阻,以增强对弱信号的响应。采用单片式探测器对400-1000nm波长范围内进行辐射通量定标,系统不确定度包括:探测器响应拟合不确定度7‰,从陷阱探测器到单片探测器的传递不确定度3.14‰,光源波动小于1‰,系统重复性的不确定度3‰,最终合成不确定度为8.3‰,测量结果满足要求。For radiation flux calibration based on double-monochromator, in order to overcome the faults of small viewing field and small aperture of trap detector, a radiation flux calibration method with a one-diode detector in stead of trap detector is proposed. A piece of silicon detector vertical to light path is adopted, thus making its photo-sensitive surface nearly overlap with aperture stop and aperture angle of the detector can be enlarged. An OPA128 operational amplifier with extreme low bias current and big gain is adopted for enhancing the response to weak signals. Radiation flux calibration is carried out within the wavelength range between 400nm-1000nm. System uncertainties include: fitting uncertainty 7‰ of the detector response, transfer standard uncertainty 3.14‰, light source fluctuation less than 1‰, uncertainty 3‰ of the system repeatability and the final synthetic uncertainty 8.3‰.

关 键 词：辐射通量定标 陷阱探测器 单片式探测器 单色仪 

分 类 号：TN247[电子电信—物理电子学]