光折变BaTiO_3晶体缺陷的分析电子显微镜研究  

ANALYTICAL ELECTRON MICROSCOPY OF DEFECTS IN PHOTOREFRACTIVE BaTiO_3 CRYSTAL

作　　者：杨翠英[1] 张道范[1] 吴星[1] 周玉清[1] 冯国光[1] 

机构地区：[1]中国科学院物理研究所

出　　处：《物理学报》1989年第12期2003-2007,共5页Acta Physica Sinica

摘　　要：用分析电子显微镜研究了顶部籽晶法生长的BaTiO_3晶体内的缺陷。成功地制备出薄区厚约100nm内含包裹体的电子显微镜样品。用透射电子显微镜(TEM),配合电子能量损失谱(EELS)确定了BaTiO_3单晶内包裹体的相分为:非晶的Ba-Ti-O和高Ti-Ba氧化物——Ba_6Ti_(17)O_(4c)在BaTiO_3单晶试样中,还观察到其它几种类型的微缺陷。Defects in photorefractive BaTiO_3 crystal, obtained by the top seed solution growth method, have been studied by analytical electron microscopy. Thin foils containing inclusions for transmission electron micrsocopy (TEM) were prepared by ion milling the mechanically polished thin sections. Combining diffraction and electron energy loss spectroscopy in a TEM, the inclusions were identified as amorphous Ba-Ti-O and Ba_6Ti_(17)O_(40). Other microdefects which are only visible in the TEM have been identified as crystalline precipitates.

关 键 词：晶体缺陷 BATIO3 电子显微镜 

分 类 号：O77[理学—晶体学]