一种快速高精度三线阵CCD三维轮廓术  

A Fast 3D Profilometry with High Precision by Using of Three Lines CCD

作　　者：蒋克俭[1] 赵宏[1] 宋元鹤[2] 李天石[1] 

机构地区：[1]西安交通大学激光与红外应用研究所,陕西西安710049 [2]空军工程大学电讯工程学院,陕西西安710077

出　　处：《激光与红外》2005年第5期368-369,共2页Laser & Infrared

摘　　要：文中提出一种新的快速三维轮廓测量方法,将三个1024像素的光敏元阵列等间距封装在一起,无须通常的机械或电子式的移相操作,只要物体的位移量和空间采样间隔满足整数倍的比例关系,一次性连续扫描采样就可以获得三幅相位图。通过三路DSP处理器自动计算,就可完成整个测量过程。实验结果表明,本文提出的三线阵CCD相位测量系统具有较高的测量精度和测量速度,有很高的实用价值。A new fast 3D profilometry is presented in this paper.Three lines CCD arrays,1024 pixels each,are mounted together with the same distance intervals.Needless to perform phase shift operations,the CCD can consecutively scan and grab 3 phase distributed pictures which will be separately calculated by 3 DSP processors.Thus the whole measurement process is finished.The experimental results show that the phase measurement system by using 3 lines CCD has high application values for its high precision and speed.

关 键 词：线阵CCD DSP处理器 相位测量 三维轮廓测量 

分 类 号：TN206[电子电信—物理电子学]