原子分辨率晶体结构的高分辨电子显微学研究  

HREM study on interface structure at atomic resolution

作　　者：唐春艳[1] 李方华[1] 

机构地区：[1]中国科学院物理研究所

出　　处：《电子显微学报》2005年第3期165-170,共6页Journal of Chinese Electron Microscopy Society

基　　金：国家自然科学基金资助项目(No.10474122).~~

摘　　要：本文以GaP{111}孪晶界面高分辨电子显微像为例,将解卷处理和动力学散射效应校正相结合的技术应用于晶体界面处显微像的研究。椭圆窗口作为一种新的手段用于含有面缺陷晶体的傅里叶滤波和衍射振幅校正。所用GaP{111}高分辨像的模拟参数对应于200kV场发射高分辨电子显微镜。经过图像处理之后,不同样品厚度的模拟像均转变成结构像,其中原子柱均显示在正确的位置上。对GaP进行解卷处理的临界厚度做了详细的讨论。The image deconvolution technique in combination with dynamical scattering effect correction developed previously for crystal defect investigation has been modified to meet the interface study and applied to a ｛111｝ twin model of GaP. Elliptical windows are utilized as a new means for Fourier filtering and correcting the amplitudes of reflections. Images were simulated with a 200 kV field-emission high-resolution electron microscope. After the image restoration, images simulated with different specimen thickness have been transformed into the structure images with atomic columns revealed individually at correct positions. The critical thickness of GaP was discussed.

关 键 词：界面结构 解卷处理 动力学散射效应校正 原子分辨率 晶体结构 

分 类 号：O762[理学—晶体学]