微柱分离-ICP-MS测定高纯氧化钆中14种稀土杂质  

Determination of REE Impurities in High-purity Gd_2O_3 with ICP-MS after Micro-column Separation

作　　者：李继东[1] 伍星[1] 郑永章[1] 

机构地区：[1]北京有色金属研究总院分析测试中心,北京100088

出　　处：《分析测试学报》2005年第4期32-34,38,共4页Journal of Instrumental Analysis

基　　金：科技部-科技基础性工作专项资助课题(基2001-16)

摘　　要：研究了采用自制微柱分离装置分离Gd2O3基体的条件,99.9%以上基体被分离,分离周期为36 min.建立了高纯Gd2O3中分离Gd后测定Yb、Lu以及内标补偿法直接测定其它12种稀土杂质的ICP-MS分析方法.定量下限为0.08～0.80μg/g,加标回收率为85%～115%,相对标准偏差为1.1%～8.5%.方法可满足快速测定99.999%Gd2O3中14种稀土杂质的要求.Amethod forthe separation ofYb and Lu fromthe Gd 2 O 3 matrixto eliminate the mass spectral inter-ference of the matrix was developed using a self-assembled micro-column device.The whole process required only36min.Yb and Lu were determined with ICP-MS after separation,whereas the other12REE impurities were determineddirectlywithICP-MSusinginternal standardmethodtoeliminate the matrixeffects.The deter-mination limits for REEs were0.08-0.80μg/g,the RSD of the determinations were1.1%-8.5%and the recoveries of standard addition were85%-115%.The method was rapid and easy to operate.It has been applied to the determination of REE impurities in99.999%Gd 2 O 3 .

关 键 词：微柱分离 电感耦合等离子体质谱 高纯Gd2O3 稀土杂质 

分 类 号：O657.31[理学—分析化学] O614.33[理学—化学]