动态接触电阻测量及触点失效预测研究  

Research on dynamic contact resistance measurement and failure prediction of relay contacts

作　　者：陈鹏[1] 陆俭国[1] 姚芳[1] 李新[1] 

机构地区：[1]河北工业大学,天津300130

出　　处：《电工电能新技术》2005年第3期27-30,共4页Advanced Technology of Electrical Engineering and Energy

基　　金：国家自然科学基金资助项目(59977012)

摘　　要：用动态接触电阻测量系统进行了电磁继电器失效检测试验,监测了其触点闭合过程的接触压降。试验发现闭合过程的触点接触压降为随时间复杂变化的衰减波形,经历了由动态的弹跳、微振动再到静态的过程。数据分析表明:继电器接触失效与闭合过程的弹跳时间及接触电阻峰值有一定关系,可综合考虑弹跳时间操作次数曲线及接触电阻峰值-操作次数曲线的变化规律对继电器触点进行失效预测。The contacts voltage of counterpart contacts in the close course of electromagnetic relay is observed and recorded in its failure tests using dynamic contact resistance measurement system. It is found that the voltage varies with time and its wave takes on complicated variation and attenuation. Also, the contact experiences dynamic bouncing, tiny vibration and static state with time. The analysis on test data shows that the contact failure of relay, to a certain extent, is related to the bouncing time and the maximum value of contact resistance in the close course. Therefore, the curve of variation of bouncing time to operating times and maximum value of contact resistance can be considered synthetically for forecasting contact invalidation of relay.

关 键 词：电磁继电器 触点 失效预测 

分 类 号：TM501.3[电气工程—电器]