基于蚂蚁算法和遗传算法的时序电路测试生成  

Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm

作　　者：许川佩[1,2] 李智[1] 莫玮[1] 

机构地区：[1]桂林电子工业学院电子工程系 [2]西安电子科技大学机电工程学院 西安 710071

出　　处：《电子与信息学报》2005年第7期1157-1161,共5页Journal of Electronics & Information Technology

基　　金：国家自然科学基金(60266001)资助课题

摘　　要：为提高时序电路的测试生成效率,该文提出一种新的基于蚂蚁算法和遗传算法的时序电路测试矢量生成算法。针对国际标准时序电路的实验结果表明,该交叉算法既充分发挥了两种算法的优点,又克服了各自的缺点, 与其它同类测试生成算法相比,获得了较好的故障覆盖率和测试集。说明采用蚂蚁算法和遗传算法的交叉算法是成功的。This paper presents a new test pattern generation technique based on ant algorithm and genetic algorithm for improving the test generation efficiency for sequential circuits. Experimental results for the sequential benchmark circuits show that the hybrid approach not only takes full advantage of utilizing both algoritmus, but also overcomes their disadvantages. It can achieve higher fault coverages and more compact test sets when compared to other similar test generation algorithms, demonstrating the combined algorithm is a successful algorithm.

关 键 词：时序电路 测试生成 蚂蚁算法 遗传算法 

分 类 号：TN407[电子电信—微电子学与固体电子学]