织构材料残余应力的ODF分析─方法的数学原理  

THE ODF ANALYSIS FOR MACROSCOPIC RESIDUAL STRESS IN TEXTURED MATERIALS──The Mathematic Fundamentals of the Method

作　　者：刘毓舒[1] 

机构地区：[1]上海交通大学

出　　处：《材料研究学报》1995年第6期486-490,共5页Chinese Journal of Materials Research

摘　　要：利用Ｘ射线衍射测定材料的残余应力时，织构的存在引起材料宏观弹性各向异性，从而导致εψ－ｓｉｎ２ψ关系丧失线性．为了获取这类材料应力分析的近真应力－应变关系，必须定量地考虑材料中晶粒择优取向对宏观弹性性质的影响．近年来在织构ＯＤＦ分析法的基础上，相继提出适于织构材料应力分析的数学方法，本文详尽地阐述了这种方法的基本原理，并尽可能提供了所需数学处理的细节．所述方法也力图博采众长，以期尽量减少测试和计算的工作量．By using XRD to determine the macroscopic residual stress in textured materials,the linear behaviour of the classical sin2ψ-law does not hold because of elastic anisotropy caused by the presence of textures.In order to obtain an approximately real relationship between stress and strain for stress analysis,one must quantitatively consider the influence of texture on macroscopic elastic propefties.In recent years some mathematic methods for this,based on the ODF analysis of texture, have been proposed.In this paper the mathematic fundamentals of the methods and the procedures used for the calculations are described in detail.For the purpose of practical application,the designed method can as far as possible reduce the workloads for measurements and calculations by means of the low resolution texture analysis.

关 键 词：织构材料 弹性各向异性 残余应力 ODF分析 

分 类 号：TB302[一般工业技术—材料科学与工程]