估算二元曲线法在高合金X射线荧光分析中的应用  

Application of Estimated Binary Calibration Curve Method in X-Ray Fluorescence Analysis of High Alloys

作　　者：梁鈺 何芸华 

机构地区：[1]上海钢铁研究所

出　　处：《冶金分析》1989年第5期35-38,共4页Metallurgical Analysis

摘　　要：本文研究了应用多元标准试样及JIS校正常数估算及建立由分析元素和基体元素构成的二元曲线并成功地应用于高合金的分析。文章还对二元曲线的含义、曲线对标样的要求以及方法的稳定性和局限性进行了讨论。In this paper,the calibration curve for binary system consisting of an analyte and the principal constituent element is estimated and derived by using multicomponent standard samples and correction coefficients from JIS. The method has been applicated to analyse high alloys.In addition, the meaning of binary curve, standard samples for making the curve, the suitability and limitation of the method are discussed.

关 键 词：高合金钢 X射线荧光谱 二元曲线法 

分 类 号：TG142.15[一般工业技术—材料科学与工程]