低压限流断路器开断过程重击穿现象及防止措施  

Restriking Phenomena in Current Limiting Circuit Breaker and Restraining Methods

作　　者：陈勇[1] 陈德桂[1] 邱祖述[1] 周勇[1] 

机构地区：[1]西安交通大学,上海电器科学研究所

出　　处：《电工技术学报》1995年第3期43-46,共4页Transactions of China Electrotechnical Society

基　　金：机械工业部国家重点企业技术开发项目科研基金

摘　　要：本文采用光电测试系统，观察到在低压限流断路器开断过程中的电弧电压跌落现象。对断路器测试分析发现，这一现象是由电弧通道转移至触头区引起，而造成电弧通道转移的主要原因是发生在触头区的重击穿现象。通过分析影响开断过程电弧重击穿现象的主、要因素，本文提出了几种抑制开断过程重击穿现象、提高断路器限流特性的有效方法。Based on optoelectronic measuring system, arc voltage drops are observed in arc running process of current limiting circuit breaker. By analyzing the investigated model,we can found that restriking phenomena occur which cause arc channel commutate to the contact region. By discussing the influences of restriking phenomena, some effective methods are presented for restraining restriking phenomena and improving the performance of current limiting.

关 键 词：断路器 电弧 击穿 试验 

分 类 号：TM561.07[电气工程—电器]