X射线荧光光谱法在稀土元素分析中的应用  

X-Ray Fluorescence Spectromtric Analysisof Rare Elements

作　　者：陆少兰[1] 李世珍[1] 郝贡章[1] 许佩珍[1] 李建华 刘洋[1] 

机构地区：[1]北京有色金属研究总院

出　　处：《分析试验室》1995年第1期66-70,共5页Chinese Journal of Analysis Laboratory

摘　　要：本文研究了Ｘ射线荧光光谱在混合稀土氧化物和高纯稀土氧化物分析中的应用，并探讨了在常量分析中影响分析准确度和精密度的主要因素：样品及标样制备，基体效应校正方法和在痕量分析中降低检测限的方法：选择最佳测量条件，降低背景，与分离富集手段相结合，取得满意的结果。X-ray fluorescence spectrometric analysis ofmixed rare earth oxides and highly pure rareearth oxides are studied in the paper. SOme mainfactors which influence the accuracy and the pre-cision in macro analysis are investigated includingsample and standard preparation and correctionof the matrix effects.The methods of loweringthe determination limit in trace analysis are alsoresearched,which include choosing the best mea-surement conditions,lowering background andthe method of separation and concentration

关 键 词：稀土元素 X射线荧光光谱 

分 类 号：O614.33[理学—无机化学] O657.34[理学—化学]