发射光谱测定微量稀土杂质用的一种新的载体KBH_4的研究  

The Study on a New Carrier Used to Determinate Trace RE Impurities by Spectral Analysis

作　　者：王淑英[1] 潘利华[1] 

机构地区：[1]中国科学院长春应用化学研究所

出　　处：《光谱实验室》1995年第4期23-26,共4页Chinese Journal of Spectroscopy Laboratory

摘　　要：介绍了高纯稀土氧化物中微量稀土杂质的光诸测定方法。本工作用碳粉做缓冲剂，ＫＢＨ_４做载体，用化学方法将大量稀土（基体）分离掉，而后对余下微量的稀土杂质进行光谱测定。只要取样量不少于１克，则可测定的纯度为９９．９９９９５％的稀土样品。new carrier used to determinate trace rare earth impurities in high purity rare earth oxide by spectral analysis has been studied.Take 1g rare earth oxide example.First,the rare earth oxide as matrix,in the example was separated,the other rare earth oxides, as the remainder,were determinated by spectrometry in this work.The sensitivity in the analysis can be increased,if KBH4 is as a carrier,purity of the determinated rare earth is 99.99995%.

关 键 词：稀土 发射光谱分析 硼氢化钾 稀土氧化物 

分 类 号：O614.33[理学—无机化学] O657.31[理学—化学]