气压－波长扫描F－P干涉仪测定半导体激光器线宽  

A New Pressure-Waveiength Scaning F-P Interferometer Measuring the Linewidth of Semiconductor Laser

作　　者：徐伟弘[1] 汪开源[1] 

机构地区：[1]南京东南大学电子工程系

出　　处：《光通信技术》1995年第4期305-308,共4页Optical Communication Technology

摘　　要：介绍一种基于多光束干涉原理设计的气压－波长扫描Ｆ－Ｐ干涉仪，用来测定半导体激光器线宽的实验装置系统，可用于分析半导体激光器谱线精细结构，它具有设备简单、操作方便、精度高、易于实现等优点。This paper is introduced a new pressure-scaning wavelength F-P interferometer based on the principle of multi-optic beam interfering. It could he used to measure the linewidth of LD's, to analyze the fine spectrum structure of LD's. It has the advantages of high precise, simple easing to operate and easing to make.

关 键 词：半导体激光器 激光器线宽 F-P标准具 

分 类 号：TN248.4[电子电信—物理电子学] TN243.06