基于扇出源单故障传播的平行码临界路径跟踪故障模拟  

PARALLEL PATTERN CRITICAL PATH TRACING FAULT SIMULATION BASED ON SINGLE FAULT PROPAGATION OF FANOUT STEMS

作　　者：石茵[1] 魏道政[1] 

机构地区：[1]中国科学院计算技术研究所CAD开放实验室

出　　处：《计算机学报》1995年第8期580-587,共8页Chinese Journal of Computers

摘　　要：本文提出了一种快速的组合电路故障模拟方法──基于扇出源单故障传播的平行码临界路径跟踪法．临界路径跟踪法是一种十分快速的、但近似的组合电路故障模拟方法，将其同平行码故障模拟结合起来，其效率被进一步成倍地提高．为使其成为一个完全的算法，对每个非停止线扇出源故障，我们采用了平行码单故障传播法．同时，为加快其速度，本文提出了若干加速技术，用于故障模拟的各个部分．例如，事件驱动、多级活动事件栈、测试码标记向量、扩大的停止线以及平行处理时的捕获线概念等等．本算法已用Ｃ语言在ＳＵＮ４／ＳＰＡＲＣＳＬＣ上实现，文中给出了ＩＳＣＡＳ’８５的１０个组合电路的实验结果．A fast method for fault simulation of combinational circuits, parallel pattern critical path tracing based on single fault propagation of fanout stems, is presented in this paper. Critical path tracing is a high-speed, but approximate method. Its efficiency is further raised by performing critical path tracing under a group of test patterns simultaneously. To make this method complete, parallel pattern single fault propagation is used for each non-stop-line stem fault. At the same time, several efficient accelerated techniques,e. g.,event driven,multiple level stack, vector marked test patterns,extended stop line, capture line under parallel processing and so on,are used to speed up the method. This algorithm has been implemented in C on SUN 4/SPARC station SLC, and experimental results for ISCAS'85 10 benchmark combinational circuits are offered in this paper.

关 键 词：故障模拟 平行码故障模拟 组合电路 故障传播 

分 类 号：TN407[电子电信—微电子学与固体电子学]