基于单片机的电感微变量测定方法  

A Method Based on Micro Controller Unit Testing the Variation of Inductance

作　　者：涂绪坚[1] 肖静[1] 罗先喜[1] 邱志诚[1] 

机构地区：[1]东华理工学院,江西南昌330013

出　　处：《机电产品开发与创新》2005年第4期91-92,共2页Development & Innovation of Machinery & Electrical Products

摘　　要：本文介绍了一款基于单片机的电感量测量装置,应用被测电感量相对于基准电感变化所产生的相量差来计算被测电感量的实际大小。目前,电感量的测试方法很多,一般都需要借助专用的精密仪器仪表,而且难以应用在某些需要在线判断电感量是否发生变化、以及需要测定电感变化量的场合。本设计克服了上述缺陷。实验证实,本方法简单有效,可在一定范围和场合推广应用。This writer presents an inductance gager based on a single-chip processor, in which the inductance value is worked out from the difference vector between a reference inductance and the tested one. Prior to those reported previously, this gager is no necessary of accuracy instruments; Furthermore, it works well in real time processing systems, detecting whether the inductance is varying and how much it various. The validity has been proved by experiments.

关 键 词：单片机 电感量测量 微变量测定方法 相量差 

分 类 号：TM933[电气工程—电力电子与电力传动]