具有重叠衍射峰低对称晶系材料的定量织构分析  

QUANTITATIVE TEXTURE ANALYSIS FOR LOW SYMMETRY POLYCRYSTALLINE MATERIALS WITH OVERLAPPING DIFFRACTION PEAKS

作　　者：王沿东[1] 徐家桢[1] 

机构地区：[1]东北大学

出　　处：《金属学报》1995年第12期B550-B554,共5页Acta Metallurgica Sinica

基　　金：国家自然科学基金

摘　　要：本文给出了具有重叠衍射峰的低对称晶系材料织构定量分析的最新细化方法：将熵最大原则直接引入到以极图数据为约束条件的最小二乘方程中，实现了最小极密度差与熵最大两种优化的同步进行，四方晶系材料的纤维织构模拟例子表明：即使在很锐的织构组分时，依据本文的方法也可以从较少数目极图数据获得准确的织构矢量．A new algorithm of quantitative texture analysis(QTA), i. e. modified maximum entropy method(MMEM), is proposed and applied to the determination of textures in polycrystalline samples of lower crystal symmery with overlapping diffraction peaks. By introducing directly maximum entropy principle into the least square equations of pole figure inversion, the least square errors between measured and recalculated pole figures, and the optimum of maximum texture entropy may be simultaneously satisfied. Thus, the maximum entropy principle is applied to the entire processes of QTA in frame of harmonic method(HV). The simulated results of ideal fiber texture show that the precise texture vector for the materials with smooth or sharp textures will be obtained by the MMEM from the less number of pole figures.

关 键 词：织构 低对称 晶系材料 重叠衍射峰 熵 

分 类 号：O731[理学—晶体学] O76