一种快速分析电子元器件寿命特性的实用方法──图估法  

ONE PRACTICAL METHOD FOR FAST ANALYZING THELIFETIME CHARACTERISTICS OF ELECTRONIC DEVICES-GRAPHICAL METHOD

作　　者：孙振东[1] 王喜山[1] 

机构地区：[1]清华大学电子工程系,青岛大学物理系

出　　处：《青岛大学学报（自然科学版）》1995年第1期65-72,共8页Journal of Qingdao University(Natural Science Edition)

摘　　要：本文较详细介绍了一种用于电子元器件恒定应力正常寿命试验和加速寿命试验的数据处理方法─—图估法；作为举例，用该方法分析判断和估计了氦氖激光管的寿命分布规律和分布参数等寿命特性．raphical method,the lifetime date fast analyzing method that used in normal and accelerated life test for electronic devices is introduced in detail. As a example, some lifetime characteristics of He-Ne lasers,such as the law of life distribution,distributed parameters and lifetime parameters, are analyzed and estimated according to the graphical method.

关 键 词：图估法 电子元件 寿命 可靠性 

分 类 号：TN606[电子电信—电路与系统]