楔形薄膜逾渗系统的临界特性  

CRITICAL BEHAVIORS IN A WEDGESHAPED Pt-FILM PERCOLATION SYSTEM

作　　者：叶高翔[1] 葛洪良[2] 许宇庆[2] 焦正宽[2] 张其瑞[2] 

机构地区：[1]杭州大学物理系,杭州310028 [2]浙江大学物理系,杭州310027

出　　处：《物理学报》1995年第12期1993-1999,共7页Acta Physica Sinica

基　　金：浙江省自然科学基金资助的课题.

摘　　要：报道一种楔形金属薄膜逾渗系统的制备方法和测量结果,这种新型逾渗系统具有独特的非线性I-V特性和临界规律,从实验中发现:在这一各向异性系统中,普适标度关系仍然成立,分析表明:这些特性是由于该系统中随空间坐标而变化的跳跃电导效应而引起的.This paper reports the preparation of a wedgeshaped Pt-film percolation system and its critical behaviors. A strange R-I characteristic and power-law behaviors are observed. The general scaling law still holds in this anisotropic percolation system. We believe that these characteristics are caused by the location-dependence hopping effect, which is resulted from the wedgeshaped structure of the films.

关 键 词：薄膜 逾渗系统 临界特性 

分 类 号：O484.4[理学—固体物理]