能量色散X荧光法快速测定装置在稀土分析中的应用  

The Applications of EDXRFA in Rare Earth Analysis

作　　者：阎军[1] 公锡泰[1] 

机构地区：[1]清华大学核能技术设计研究院

出　　处：《稀土》1995年第2期70-76,共7页Chinese Rare Earths

摘　　要：本文描述了一套由清华大学设计的能量色散ｘ荧光法快速测定装置，介绍了它在高纯稀土分离工业性试验基地的应用情况。该装置可同时测定多个稀土元素，其性能可以满足稀土分离厂中控分析的一般需要。在试验基地两年的应用表明，该装置具有投资少，操作、维护简便，分析精度高等特点，能够比较准确地反映各工艺段的运行状况，在国内各稀土厂有一定的应用前景。An EDXRFA instrument and its application in the process analysis of the Industrial Testing Base for extracting high purity rare earth were described in this paper.The instruments can analyze several rare earth elements synchronously,the accuracy and precision meet a demend on the process analysis in the Base,With simple structure,convenient operation and maintenance,the instrument has been at work in the Base for two years and can respond to the running states correctly and rapidly.

关 键 词：能量色散X荧光 稀土 中控分析 

分 类 号：O614.33[理学—无机化学] O657.34[理学—化学]