干涉条纹可见度随光源线度和谱宽变化规律探析  

The Exploration of the Rectanguarity of Variance with Light Source Dimension and Spectrum Width

作　　者：洪林 

机构地区：[1]江苏盐城职业大学高教研究室

出　　处：《信息工程学院学报》1995年第4期20-26,共7页

摘　　要：本文从单色线光源的光强分布出发，探讨了在一般情况下，光源的线度与谱宽对干涉条纹可见度的影响，并以杨氏双缝干涉为例，得到干涉条纹可见度随光源线度和谱宽均按ＳｉｎＣ函数规律变化的结论。Based on the intensity distribution of monochromatic light source, this paper ex-plores the effect of light source dimension and spectnim width on the visibility of interfer-ence fringe under common circumstances and the author offers the example of Young'sTwo Split Interference to reach the conclusion that the visibility of interference fringe va-ries with light source demension and spectnim width according to the regularity of sincfunction.

关 键 词：光源线度 谱宽 条纹可见度 干涉 

分 类 号：O436.1[机械工程—光学工程]