采用串列静电加速器进行单粒子效应模拟试验研究  

SINGLE EVENT EFFECTS SIMULATION EXPERIMENT UTILIZING TANDEM VAN DE GRAFF ACCELERATOR

作　　者：赵大鹏[1] 唐民[1] 孟庆茹[1] 吴志宇[1] 于庆奎[1] 

机构地区：[1]北京卫星环境工程研究所

出　　处：《宇航学报》1995年第2期85-89,共5页Journal of Astronautics

摘　　要：本文描述了采用ＨＩ—１３串列静电加速器进行单粒子效应模拟试验的试验系统、试验方法和试验条件，给出了８０Ｃ３１单片机单粒子效应模拟试验结果；根据试验结果，采用ＣＲＥＭＥ程序对８０Ｃ３１单片机在三类不同轨道卫星上的单粒子翻转率进行了预计。This paper presents the experimental system utilizing Tandem Van De Graff accelerator for simulating single event effects on microcircuits. The experimental conditions and methods are discribed. The results are reported for experimental study of 80C31microcontrollers. Single event upset rate for a 80C31 microcontroller on a satellite in three different orbits is predicted on the basis of the experimental results.

关 键 词：高能粒子 辐射效应 静电加速器 模拟试验 

分 类 号：TL52[核科学技术—核技术及应用]