真空灭弧室弧后介质强度恢复的不稳定性  

Non-Stability of Post-Arcing Recovery Process in Vacuum Interrupters

作　　者：王承玉[1] 王季梅[1] 

机构地区：[1]西安高压电器研究所四室,西安交通大学电器教研室

出　　处：《中国电机工程学报》1995年第4期223-227,共5页Proceedings of the CSEE

摘　　要：本文通过测量真空灭弧室弧后恢复电压和屏蔽罩电位的波形，发现在弧后介质强度恢复过程中，屏蔽罩电位波形在接近真空灭弧室极限开断电流时，会产生严重的无规律畸变，并伴随有弧后残余粒子消散时间的延长。从而证实真空灭弧室的弧后介质强度的恢复过程不仅存在着速度的快慢，而且存在着不稳定性，这种不稳定程度随着极限开断电流的临近而加剧。它与真空灭弧室的弧后击穿和开断失败有着密切的联系。This paper measures and analyzes the waveforms of recovery voltage and shield potential in vacuum interrupters. It discovers that in shield potentialin vacuum interrupters waveforms,when breaking current is close to its limit,an unregular distortion will happen to it and the clearing of post-arcing residual particles will last for a longer time. It is proved that not only the speed of post-arcing recovery process varies,but also non-stability exists in the process. This nonstability increases as the breaking current reaches its limit. The non-stability may cause post-arcing breakdown and breaking failure.

关 键 词：真空开关 真空灭弧室 屏蔽罩电位 稳定性 

分 类 号：TM503.2[电气工程—电器]