真空灭弧室中屏蔽罩电位动态测试及分析  

Dynamic Test and Analysis of Shield Potential in Vacuum Interrupters

作　　者：王承玉[1] 马志赢 王季梅[1] 

机构地区：[1]西安高压电器研究所四室,西安交通大学电器教研室

出　　处：《中国电机工程学报》1995年第4期217-222,共6页Proceedings of the CSEE

摘　　要：本文通过测量真空灭弧室中屏蔽罩电位与电弧电压和恢复电压关系的动态变化波形，探讨真空灭弧室在短路电流分断过程中，真空电弧的燃弧规律和弧后介质强度恢复规律。在试验结果的基础上，对真空灭弧室屏蔽罩电位与触头间电压的动态关系进行了数学推导，从理论上分析了屏蔽罩电位的变化规律，证实这是一种研究真空灭弧室性能的可行方法。This paper studies the arcing and post-arcing medium-intensity recovery of vacuum arcs during short-circuit breaking of a vacuum interrupter by measuring the dynamic charge waveforms of the relationship between shield potential,arc voltage and recovery voltage. On the basis of the test results,it makes mathematical derivation for the relationship between the vacuum interrupter shield potential and the voltage across contact gap. It also makes a theoretical analysis of changing generality of the shield potential. It is proven that this method is feasible for deeper study of vacuum interrupter performance.

关 键 词：真空开关 真空灭弧室 测试 屏蔽罩电位 

分 类 号：TM501.2[电气工程—电器]