高度污染敏感有效载荷的真空烘烤技术  

Vacuum Bakeout Technology for Spacecraft Payload with High Sensitive Contamination

作　　者：周传良[1] 

机构地区：[1]北京卫星环境工程研究所,北京100094

出　　处：《航天器环境工程》2006年第6期340-343,共4页Spacecraft Environment Engineering

摘　　要：对分子污染高度敏感的航天产品,如光学相机、CCD成像系统等,真空烘烤是有效的污染控制手段。文章介绍了真空烘烤设备的结构和技术指标,并详细地描述了具体的烘烤程序,以满足航天器洁净度等级的要求。The vacuum bakeout is an efficient methode for contamination control of spacecraft payload with high sensitive contamination, such as optical camera, CCD imaging system. The proper bakeout is also used for spacecraft hardware with different contamination sensitivities, such as solar cell array and SOR for temperature control. The paper describes the facility, specifications and procedures of the vacuum bakeout for meeting requirements of spacecraft cleaning level.

关 键 词：分子污染 有效载荷 真空烘烤 控制手段 技术指标 烘烤设备 航天产品 成像系统 洁净度 航天器 相机 描述 结构 光学 程序 

分 类 号：V[航空宇航科学技术]