非晶硅平板探测器不一致性校正技术  

Non-uniformity correction technique for amorphous silicon flat-panel detector

作　　者：梁丽红[1] 王晓[2] 路宏年[3] 

机构地区：[1]中国特种设备检测研究中心,北京100013 [2]华北航天工业学院电子工程系,河北廊坊065000 [3]北京航空航天大学机械工程及自动化学院,北京100083

出　　处：《光电工程》2005年第8期36-39,共4页Opto-Electronic Engineering

基　　金：国家自然基金资助项目(60172014)

摘　　要：针对非晶硅平板探测器不一致性偏大,导致探测器灵敏度出现非线性的问题,提出了基于探测器像元灵敏度均值的校正方法。此方法基于线性拟合校正的思想,在一定管电压下,改变管电流采集一组探测器基准图像,利用这组图像与其相应均值进行拟合,再把拟合系数作为校正因子对试件成像进行校正。该方法通过缩小校正的输入范围,满足线性系统成立的条件,使非线性问题线性化,实现了各像元点对点的线性校正。实验结果表明,与常规线性校正相比,该方法不仅提高了系统成像的动态范围,而且随着标准差的降低,信噪比相应地提高了近1.3倍。In order to solve the problem of non-linearity of detector＇s sensitivity, a correction method based on pixel-sensitivity-mean is proposed in the paper. According to the concept of linear-fitting correction, the correction factors for correcting the test-piece image are obtained by reference images and their corresponding means captured at fixed tube voltage and different tube current. Such correction reduces the input range, the condition of linear system is fulfilled and linear correction on corresponding pixel is effective in this range. Experiments result indicates that compared with normal linear correction, the correction method features bigger system＇s dynamic range and bigger signal-noise-ratio （1.3 times） with the reduction of standard deviation.

关 键 词：非晶硅平板探测器 线性校正 像元灵敏度 

分 类 号：TP391[自动化与计算机技术—计算机应用技术] TP73[自动化与计算机技术—计算机科学与技术]