基于BIST软件测试思想的单元测试框架  

Unit Test Framework Based on BIST Software Test Idea

作　　者：杨艳芳[1] 徐拾义[1] 

机构地区：[1]上海大学计算机学院,上海200072

出　　处：《计算机工程》2005年第17期92-94,共3页Computer Engineering

基　　金：国家自然科学基金资助项目(60173029;2002)

摘　　要：BIST是一种成熟的硬件可测性设计的方法,BIST软件测试思想则借用了该技术,它主要包括模板和自治测试部分两大基本结构。在该思想的指导下,整合测试用例、测试点、插装函数、测试报告等测试要素,提出了各个要素的存储或使用方式,以路径覆盖为测试目标,提出了一种BIST软件自测试的测试框架。实践证明,该测试框架有利于BIST软件测试思想的进一步研究和实现。BIST （build-in self-test） has been one of the mature methods for hardware testing and design for testability （DFF） for a long time. The BIST sottware test, hereby, whose idea borrows from hardware testing, mainly includes two parts： template and self-test. Based on this idea, the paper develops a unit test framework, which integrates various ways of testing, such as test case generation, checkpoint set up, plug-in function designing, test report generation. The way of preserving and utilizing these factors is discussed. Also the paper presents the framework of BIST aiming at the path coverage, and the way of doing so is proved to be effective in testing software by an example of unit testing. This work will be greatly conductive to further study and the realization of BIST software test idea,

关 键 词：软件测试 BIST 白盒测试 路径覆盖 测试框架 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]