温梯法生长的Ti:Al_2O_3晶体的光谱分析  

Spectral Analysis of Ti:Al_2O_3 Crystal Grown by Temperature Gradient Technique

作　　者：章佶[1] 孙真荣[1] 王祖赓[1] 司继良[2] 王静雅[2] 杭寅[2] 徐军[2] 

机构地区：[1]华东师范大学物理系 [2]中国科学院上海光学精密机械研究所,上海201800

出　　处：《人工晶体学报》2005年第4期657-660,681,共5页Journal of Synthetic Crystals

基　　金：国家自然科学基金(No.60478024)资助项目

摘　　要：本文研究了不同掺Ti3+浓度对温梯法生长的Ti:Al2O3晶体吸收光谱、荧光光谱和X射线衍射光谱的影响。根据吸收光谱提出了一个色心模型。对比了样品各处420nm荧光谱,发现掺Ti3+浓度越大,该处荧光强度越弱,同时解释了420nm处荧光峰的起源。对比了样品各处720nm处的荧光谱,发现掺Ti3+浓度越大,该处荧光强度越强。X射线衍射谱(XRD)表明,衍射峰强度随掺Ti3+浓度的增大而逐渐增强。Al2O3 single crystals doped with different concentrations of Ti^3＋ were grown by temperature gradient technique （TGT）. The absorption spectra, fluorescence spectra and XRD spectra were measured and analyzed. A color-center model was proposed to successfully explain the experimental results of the absorption spectra, The intensity of the fluorescence peak at 420nm decreases, and the intensity of the fluorescence peak at 720nm increases as the concentration of Ti^3＋ increase. XRD spectra show that the intensity of diffraction peak increases with increase of Ti^3＋ concentration.

关 键 词：Ti^3+ AL2O3 色心 光谱 温度梯度法 

分 类 号：O782[理学—晶体学]