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作 者:沈彦[1] 赵永刚[1] 郭士伦[1] 李井怀[1] 刘国荣[1] 李静[1] 王林博[1] 王同兴[1]
机构地区:[1]中国原子能科学研究院放射化学研究所,北京102413
出 处:《核技术》2005年第9期693-696,共4页Nuclear Techniques
摘 要:在核诊断和核保障技术环境样品分析中,对含铀气溶胶微粒(极少的微米级粒子)进行元素和同位素分析是十分重要的。扫描电镜(SEM)和二次离子质谱仪(SIMS)的联用是公认的微粒同位素分析技术路线之一,它需要用扫描电镜对样品垫上感兴趣的微粒进行快速查找和准确定位,最终用SIMS对同一微粒进行再定位和同位素分析。本文报导在直径为25mm的石墨垫片上利用核孔膜作参考标记并进行SEM-SEM微粒精确定位的试验方法和结果。研究表明,用核孔膜作定位标记,平均定位偏离为(5.8±2.6)μm,其精确度不亚于国外采用的其它方法。In the analysis of environment samples for nuclear diagnosis and nuclear safeguard technology, it is very important to analyze the elemental and isotopic compositions of uranium aerosol particles (usually very few and in μm-size). The combination of SEM (scanning electron microscope) and SIMS (secondary ion mass spectrometer) is one of the accepted working lines to analyze isotopic compositions of particles. But it required fast searching and accurate locating the interested particles on the sample planchet in SEM and then re-locating the particles and analyzing their isotopic composition in SIMS. This paper describes the method of making reference marks on 25mm diameter graphite planchet by using nuclear track membrane and presents the result of relocation of simulated particles from SEM to SEM. The study shows that the average deviation of relocation is 5.8±2.61μm with reference marks by using nuclear track membrane. The accuracy is not lower than that by using other patterns' reference marks.
分 类 号:TL815.7[核科学技术—核技术及应用] TL941.2
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