Determination of Thermal Diffusivity of a Manganite Thin Film  

作　　者：朱东林 刘晓峻 黄巧建 张淑仪 

机构地区：[1]State Key Laboratory of Modern Acoustics and Institute of Acoustics, Nanjing University, Nanjing 210093

出　　处：《Chinese Physics Letters》2005年第10期2659-2662,共4页中国物理快报（英文版）

基　　金：Supported by the National Natural Science Foundation of China under Grant No 10374041, the Program for New Century Excellent Talents in Universities from the Ministry of Education of China under Grant No NECT-04-0456.

摘　　要：Thermal diffusivity has been investigated in a manganite thin film La0.6Sr0.4MnO3 by means of transient grating （TG） technique at room temperature. A new method, which is generalized to two-layered samples of the thin film deposited on a semi-infinite substrate, is established to fit the TG signals. The thermal diffusivity of the Lao.6Sro.4MnO3 thin film with a thickness of 200nm on an MgO （100） substrate is determined to be 0.92mm^2/s, which is slightly smaller than that of the single crystal sample （1 mm^2/s）.Thermal diffusivity has been investigated in a manganite thin film La0.6Sr0.4MnO3 by means of transient grating （TG） technique at room temperature. A new method, which is generalized to two-layered samples of the thin film deposited on a semi-infinite substrate, is established to fit the TG signals. The thermal diffusivity of the Lao.6Sro.4MnO3 thin film with a thickness of 200nm on an MgO （100） substrate is determined to be 0.92mm^2/s, which is slightly smaller than that of the single crystal sample （1 mm^2/s）.

关 键 词：CA LA1-XSRXMNO3 SR 

分 类 号：O484[理学—固体物理]