碳纳米管膜电阻率的测定与导电机理  

Measurement of Resistivity and Investigation of Electronic Transport for Carbon Nanotube Film

作　　者：胡陈果[1] 叶翠兰[1] 陈杨[1] 

机构地区：[1]重庆大学数理学院,重庆400030

出　　处：《重庆大学学报（自然科学版）》2005年第9期112-115,共4页Journal of Chongqing University

基　　金：国家自然科学基金资助项目(60376032)

摘　　要：测定了碳纳米管膜电阻率随温度的变化,结果表明,碳纳米管膜的电阻率随温度升高呈下降趋势,表现为负的温度效应.建立了碳纳米管膜的导电模型,推导出了碳纳米管膜电阻率的计算公式,并把理论计算与实验结果进行了比较,发现理论结果与实验数据符合很好.讨论了碳纳米管膜电阻率与碳纳米管直径的关系.Temperature-depended resistivity of carbon nanotube film is measured and the results show negative temperature effect because the resistivity is decreased as the temperature increased. An electronic transport model for the carbon nanotube film is set up and the resistivity calculation formula is deduced, whose calculating result is compared with experimental datum. It shows that theoretical calculation is well contented with experiment results. Then, the relationship between resistivity and diameter of the carbon nanotube is discussed.

关 键 词：碳纳米管膜 电阻率 导电模型 Neugebauer—Webb理论 

分 类 号：O462.4[理学—电子物理学]