利用受激发射损耗(STED)显微术突破远场衍射极限  

Breaking Through the diffraction limit of far-field Optical microscopy by stimulated emission depletion (STED)

作　　者：陈文霞[1] 肖繁荣[1] 刘力[1] 王桂英[1] 

机构地区：[1]中国科学院上海光学精密机械研究所,上海201800

出　　处：《激光与光电子学进展》2005年第10期51-56,共6页Laser & Optoelectronics Progress

基　　金：国家重大基础研究973(2002BC713808);国家自然科学基金(60408007)资助课题。

摘　　要：远场光学显微镜受衍射极限分辨率的限制,而近场光学显微镜南于缺乏层析能力,则无法实现超分辨的三维成像。研究了既可突破远场光学显微术的衍射极限分辨率又可实现三维成像的成像技术——受激发射损耗(STED),综述了STED的分辨率与STED光的光强、延迟时间、光斑空间分布等主要参数的关系.以及该技术的最新进展和应用前景。The resolution of far-field microscopy is limited by the diffraction limit, while near-field microscopy lacks the sectional function to image 3D pictures. The imaging technology called stimulated-emission-depletion （STED） which breaks through the diffraction limit of far-field optical microscopy and implements 3D imaging is studied. The relationships between the STED resolution and the intensity, delay time and the spatial distribution of the STED pulses are summarized and the new advances and the application prospect of STED microscopy are introduced.

关 键 词：分辨率 衍射极限 受激发射损耗 时间特性 空间特性 光学显微术 受激发射 远场 损耗 近场光学显微镜 

分 类 号：TN24[电子电信—物理电子学] TH742[机械工程—光学工程]