双处理器方案在智能测试仪中应用  

Application of dual-processor in intelligent tester

作　　者：刘海峰[1] 刘百芬[1] 

机构地区：[1]华东交通大学电气与电子工程学院,江西南昌330013

出　　处：《电力自动化设备》2005年第11期59-61,共3页Electric Power Automation Equipment

摘　　要：根据现代测试仪器的发展趋势,采用双处理器方案研制出了一种多功能智能测试仪,并对该测试仪的性能进行了测试。详细介绍了AD7714的工作原理,内部结构图。数字信号处理采用新型数字信号处理器(DSP)TMS320LF2407A。由于DSP数据运行计算速度远大于MCU的处理速度,故在DSP+MCU双处理器方案中给出了DSP与MCU之间数据传输的解决办法,并通过在实验室条件下进行测试,得出了所测得的几组实验数据,从实验数据中可以看出该测试仪的优良性能。该仪器具有很好的市场前景与应用前景。According to the development trend of modem tester,a muhi-funetional intelligent tester with two processors is developed and tested. The working principle and internal structure of AD7714 are introduced in detail. TMS320LF2407A is adopted for digital signal processing. Because the computing speed of DSP is much faster than that of MCU,a solution is provided for data transmission between DSP and MCU. Tests are carried out in lab and the measured data show its good performance and application prospect.

关 键 词：双处理器 智能测试仪 数据传输 

分 类 号：TM930.9[电气工程—电力电子与电力传动]