双光束光电二极管阵列检测器的设计  

Design of dual beam diode array detector

作　　者：申爽[1] 唐祯安[1] 李彤 

机构地区：[1]大连理工大学电子工程系,辽宁大连116024 [2]大连依利特分析仪器有限公司,辽宁大连116011

出　　处：《光电工程》2005年第10期62-65,共4页Opto-Electronic Engineering

摘　　要：由于普通光电二极管阵列检测器无法克服光源波动造成的影响,故设计开发了一种双光束光电二极管阵列检测器。该检测器采用光导纤维束将光源发出的光分成两束,在斩光器的调制下分时射入样品吸收池和参比吸收池。透射出的光信号通过光导纤维束射到狭缝上,被凹面光栅分光成像于光电二极管阵列上。在斩光器和后续电路的配合下,实现了在同一个光电二极管阵列上信号光光谱、参考光光谱和暗电流的分时测量。由于采用参考光光谱和光电二极管阵列暗电流对信号光谱进行实时补偿,可以使基线短期噪声降低为1×10-5AU,漂移降低为1×10-4AU/h。Because general diode array detector cannot avoid the noise and drift resulted from the intensity fluctuation of light source, a dual beam diode array detector is designed. The ray of light source is divided into signal ray and reference ray by fibers. The dual beams respectively enter into the sample pool and reference pool after it passes through the chopper, Both signal beam and reference beam are projected into a slit through fibers and imaged on the photodiode array by concave grating respectively. The signal spectrum, reference spectrum and dark current of photodiode array can be measured on the same photodiode array under the control of the chopper and accessorial circuits. Due to real-time compensation to signal spectrum is implemented by reference ray and the dark current of photodiode array, which can effectively depress the noise and drift, short-term noise and drift is reduced to 1 × 10^-5 AU and 1 × 10^-4AU/h, respectively.

关 键 词：双光束 光电二极管阵列 检测器 

分 类 号：TN311[电子电信—物理电子学]