用功率谱密度坍陷评价光学元件波前中频误差特性  

Evaluating intermediate frequency error property of wavefront of optical components with PSD collapse

作　　者：程晓锋[1] 郑万国[1] 蒋晓东[1] 任寰[1] 钟伟[1] 许华[1] 景峰[1] 

机构地区：[1]中国工程物理研究院激光聚变研究中心,四川绵阳621900

出　　处：《强激光与粒子束》2005年第10期1465-1468,共4页High Power Laser and Particle Beams

基　　金：国家863计划项目资助课题

摘　　要：扼要介绍了光学元件波前二维功率谱密度的计算方法,并引入功率谱密度坍陷的概念描述光学元件波前频谱特性。功率谱密度坍陷是对二维功率谱密度在不同角度上进行Radon变换得到的投影,它既利用了光学元件波前的所有有效数据,又沿袭了一维功率谱密度简明直观的特点。虽然功率谱密度坍陷在结果的表现形式和量纲方面与一维功率谱密度相同,但功率谱密度坍陷在评价光学元件波前频谱特性方面比用一维功率谱密度和二维功率谱密度更具优越性。Arithmetic of two-dimensional power spectral density （2-D PSD） of large optics wavefront was briefly described and PSD collapse was introduced to evaluate the intermediate frequency error property of wavefront. As the PSD collapse is radon transform projection of 2-D power spectral density at any angle, all valid data of wavefront of optics were used in calculation of the PSD collapse and the features of 1-D PSD were inherited in PSD collapse. Although the PSD collapse is the same as 1-D PSD in unit and behaving style, it is better in evaluating intermediate frequency error property of optics wavefront than 1-D PSD or 2-D PSD. As PSD collapse calculation uses all valid data of evaluated optics wavefront and can be directly perceived through its profile, the PSD collapse is possibly the standard evaluating method of PSD.

关 键 词：功率谱密度(PSD) 功率谱密度坍陷 RADON变换 

分 类 号：TN209[电子电信—物理电子学]