第二代居民身份证制卡工艺静电测量及防护  

Electrostatic measurements and protection in the process of inlay packaging for the second generation ID cards

作　　者：聂岩[1] 周建锁 董浩然 

机构地区：[1]公安部第一研究所,北京100044 [2]北京中电华大电子设计有限责任公司,北京100044

出　　处：《电子产品可靠性与环境试验》2005年第5期43-46,共4页Electronic Product Reliability and Environmental Testing

基　　金：863计划项目(2004AA1Z1070)

摘　　要：在第二代居民身份证的制卡制证过程中,静电放电(ESD)现象比较严重,成为主要的失效原因之一。在仔细测量的基础上,给出了整个制卡过程中生产环境的静电电压测量值。这些测量数据,对进一步分析制卡层压工序ESD现象,以及身份证模块ESD指标的确定具有重要的意义。并提出了相应的静电防护措施。In the electrostatic discharge of inlay and card packaging of the second generation ID card, （ESD） is a serious problem and is considered as one of the main failure factors. Based on the careful measurement, the ambient electrostatic voltage values in the process of inlay packaging is given. The measurements are of great significance for analyzing the ESD phenomenon during inlay packaging and defining the ESD specification of the IC chip. Finally, several advices for ESD protection are presented.

关 键 词：静电放电 静电测量 静电防护 

分 类 号：TN407[电子电信—微电子学与固体电子学]