Third-order optical nonlinearities of Zn_(1-x)Mg_xO thin films  

Third-order optical nonlinearities of Zn_(1-x)Mg_xO thin films

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作  者:陈乃波 吴惠桢 徐天宁 余萍 邱东江 

机构地区:[1]Department of Physics, Zhejiang University, Hangzhou 310027 Department of Science, Zhijiang College of Zhejiang University of Technology, Hangzhou 310024 [2]Department of Physics, Zhejiang University, Hangzhou 310027

出  处:《Chinese Optics Letters》2005年第10期611-614,共4页中国光学快报(英文版)

基  金:This work was supported by the National Natural Sci-ence Foundation of China under Grant No. 10174064and 50472058.

摘  要:The Zn1-xMgxO thin films were deposited on sapphire substrates by reactive electron beam evaporation deposition (REBED). The X-ray diffraction (XRD) measurement demonstrates that these films undergo phase transition from hexagonal to cubic with increasing the Mg concentration. Absorption coefficients at 532 nm of the samples were obtained from the absorption spectra. Using optical Kerr effect, the thirdorder susceptibilities of the ternary films over a wide range of Mg concentrations were determined. The magnitude of X^(3) of the ternary Zn1-xMgxO films is order of 10^-11 esu at λ = 532 nm. The sample with phase mixture of both hexagonal and cubic structures shows the largest third-order susceptibility. The difference observed in the magnitude of X^(3) of Zn1-xMgxO films is attributed to the different microstructures of the ternary films, such as crystalline phase separation and crystal grains that enhance stimulated scattering.The Zn1-xMgxO thin films were deposited on sapphire substrates by reactive electron beam evaporation deposition (REBED). The X-ray diffraction (XRD) measurement demonstrates that these films undergo phase transition from hexagonal to cubic with increasing the Mg concentration. Absorption coefficients at 532 nm of the samples were obtained from the absorption spectra. Using optical Kerr effect, the thirdorder susceptibilities of the ternary films over a wide range of Mg concentrations were determined. The magnitude of X^(3) of the ternary Zn1-xMgxO films is order of 10^-11 esu at λ = 532 nm. The sample with phase mixture of both hexagonal and cubic structures shows the largest third-order susceptibility. The difference observed in the magnitude of X^(3) of Zn1-xMgxO films is attributed to the different microstructures of the ternary films, such as crystalline phase separation and crystal grains that enhance stimulated scattering.

关 键 词:ABSORPTION Concentration (process) Control nonlinearities Crystalline materials Measurements Microstructure Optical Kerr effect Phase transitions SAPPHIRE Zinc compounds 

分 类 号:O484.41[理学—固体物理]

 

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