Analytical modelling and free vibration analysis of piezoelectric bimorphs  被引量:1

Analytical modelling and free vibration analysis of piezoelectric bimorphs

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作  者:周燕国 陈云敏 丁皓江 

机构地区:[1]Department of Civil Engineering, Zhejiang University, Hangzhou 310027, China

出  处:《Journal of Zhejiang University-Science A(Applied Physics & Engineering)》2005年第9期938-944,共7页浙江大学学报(英文版)A辑(应用物理与工程)

基  金:Project (Nos. 10472102 and 10372089) supported by the NationalNatural Science Foundation of China

摘  要:An efficient and accurate analytical model for piezoelectric bimorph based on the improved first-order shear deformation theory (FSDT) is developed in this work. The model combines the equivalent single-layer approach for mechanical displacements and a layerwise-type modelling of the electric potential. Particular attention is devoted to the boundary conditions on the outside faces and to the interface continuity conditions of the bimorphs for the electromechanical variables. Shear correction factor (k) is introduced to modilfy both the shear stress and the electric displacement of each layer. And the detailed mathematical derivations are presented. Free vibration problem of simply supported piezoelectric bimorphs with series or parallel arrangement is investigated for the closed circuit condition, and the results for different length-to-thickness ratios are compared with those obtained from the exact 2D solution. Excellent agreements between the present model prediction with k=-8/9 and the exact solutions are observed for the resonant frequencies.An efficient and accurate analytical model for piezoelectric bimorph based on the improved first-order shear defor- mation theory (FSDT) is developed in this work. The model combines the equivalent single-layer approach for mechanical dis- placements and a layerwise-type modelling of the electric potential. Particular attention is devoted to the boundary conditions on the outside faces and to the interface continuity conditions of the bimorphs for the electromechanical variables. Shear correction factor (k) is introduced to modify both the shear stress and the electric displacement of each layer. And the detailed mathematical derivations are presented. Free vibration problem of simply supported piezoelectric bimorphs with series or parallel arrangement is investigated for the closed circuit condition, and the results for different length-to-thickness ratios are compared with those ob- tained from the exact 2D solution. Excellent agreements between the present model prediction with k=8/9 and the exact solutions are observed for the resonant frequencies.

关 键 词:Piezoelectric bimorph Analytical model Free vibration Shear correction factor First-order shear deformation theory 

分 类 号:TN384[电子电信—物理电子学]

 

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