Focusing Properties of Fractal Zone Plates with Variable Lacunarity：Experimental Studies Based on Liquid Crystal on Silicon  

作　　者：戴海涛 王昕 徐克璹 

机构地区：[1]State Key Laboratory for Advanced Photonic Materials and Devices, Department of Optical Science and Engineering,Fudan University, Shanghai 200433

出　　处：《Chinese Physics Letters》2005年第11期2851-2854,共4页中国物理快报（英文版）

基　　金：Supported by the National High Technology Development Program of China under Grant No 2002AA84TS11, the National Natural Science Foundation of China under Grant No 6987704 and the China Academy of Engineering Physics under Grant No 10176007.

摘　　要：The focusing properties of fractal zone plates （FZPs） with different structure parameters are studied experimentally. The axial irradiance of FZPs is deduced at n=4. The experimental results are in good agreement with the theoretical prediction. A method to fabricate FZPs with variable structure parameters is mentioned, and the liquid-crystal-on-silicon device is used to implement this experiment. The experimental results indicate that the focal depth of lower order FZPs is larger than that of higher order FZPs.The focusing properties of fractal zone plates （FZPs） with different structure parameters are studied experimentally. The axial irradiance of FZPs is deduced at n=4. The experimental results are in good agreement with the theoretical prediction. A method to fabricate FZPs with variable structure parameters is mentioned, and the liquid-crystal-on-silicon device is used to implement this experiment. The experimental results indicate that the focal depth of lower order FZPs is larger than that of higher order FZPs.

关 键 词：DIFFRACTION SUPERLATTICES 

分 类 号：O77[理学—晶体学]