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机构地区:[1]中国科学院长春光学精密机械研究所应用光学国家重点实验室,长春130031
出 处:《仪器仪表学报》2005年第11期1159-1162,共4页Chinese Journal of Scientific Instrument
摘 要:介绍了在该仪器上测量折射率值小于1.76和大于1.76的两种测量方法,给出了以计算机为核心的宽光谱高精度折射率全自动测量仪的基本组成、主要误差源和测控软件的一级数控流图,用该仪器对包括红外材料锗在内的多种样品进行了测量并给出了部分测量结果,结果表明:在365.0nm至2600nm和2600nm至10600nm的波长范围内分别获得了优于±3×1-0 6和±2×1-0 4的测量精度。It presents two kinds of measurement methods of refractive index above 1.76 or below 1.76 using the photo-electric refractometer. Basic constituent and principal error sources of computerized photo-electric automatic refractometer with broad spectral range and high accuracy are introduced. The diagram of 1st grade datacontrol flow of software for instrument measuring and controlling is also introduced. The refractive indices of different optical samples and germanium belong in infra-red materials are measured with this instrument and the measuring results of samples in part are given. The experimental results show that measuring uncertainty is better than ± 3 × 10^-6 or ± 2 × 10^-4 in the wavelength ranges of 365 to 2600nm and 2600 to 10600nm respectively.
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