Nafion修饰玻碳电极伏安法测定痕量锡  

Voltammetric determination of Sn(Ⅳ)using a Nafion modified glassy carbon electrode

作　　者：向翠丽[1] 李俊华[1] 费锡明[1] 邹勇进[1] 

机构地区：[1]华中师范大学化学学院,湖北武汉430079

出　　处：《化学试剂》2005年第11期650-652,共3页Chemical Reagents

摘　　要：报道了一种用Nafion修饰玻碳电极测定痕量锡的新方法.研究了Nafion膜的有关特性和测定的优化条件,当富集时间为3min时,峰电流与Sn(Ⅳ)浓度在1×10-9～1×10-7mol/L的范围呈良好的线性关系,检测限为2.46×10-10mol/L.该法用于实际水样中痕量锡的测定,平均回收率为97.24%.This paper reported an application of using a Nation modified glassy carbon electrode to detect trace tin by voltammetry. The experimental conditions have been optimized. The peak current was proportional to the concentration of tin in the range of 1 × 10^-9 ～1 × 10^-7mol/L,and the limit of detection was 2.46 × 10^- l0 mol/L. The method has been applied to the determination of tin in water samples and the average recovery was 97.24%.

关 键 词：Nation修饰电极 伏安法 锡 

分 类 号：O657.1[理学—分析化学]