三种纳米颗粒粒径测量方法的比较  

Comparison of Three Methods of Measuring Nano-Partiles Size

作　　者：曹标[1] 陈明[1] 周崎[1] 

机构地区：[1]广州出入境检验检疫局化矿金属材料检测中心,广东广州510623

出　　处：《物理测试》2005年第6期27-29,共3页Physics Examination and Testing

基　　金：国家质检系统资助项目(GDK25-2002)

摘　　要：本文以纳米SiO2粉末为研究对象,首次比较了三种常用的纳米颗粒粒径检测方法(透射电镜法、X射线衍射法、比表面积法)的检测结果。结果表明:与透射电镜法检测结果相比,X射线衍射法及比表面积法的测量结果偏小,分别小约8.1%和5.9%。Three methods（TEM, X-ray diffraction and specific surface area） of measuring SiO2 nano-particles size were compared. The results show that for the same sample, inspection results of X-ray diffraction method is and specific surface area method is smaller than that of TEM method by about 8. 1% and 5.9 % respectively.

关 键 词：纳米颗粒 粒径 测量方法 

分 类 号：TB383[一般工业技术—材料科学与工程]