一种新的三维面形测量方法  

A Novel 3-D Contour Measurement Method

作　　者：田丰[1] 陈文艺[1] 赵宏[1] 谭玉山[1] 

机构地区：[1]西安交通大学,激光红外研究所

出　　处：《光电子．激光》1996年第3期158-162,共5页Journal of Optoelectronics·Laser

摘　　要：当一正弦光栅被投影到物体表面时，光栅条纹发生变形，物体表面的高度信息就转变为变形光栅图的相位分布。本文提出一种新的、简单的、但又非常有效的方法进行相位解调，并转化为物面高度信息。这种方法的突出特点是：所用仪器简单、对环境噪声不敏感、速度快、因而特别适用于在线检测系测量，故有很大的实用意义。When a straight-line grating with sinusoidal intensity distribution is projected on an object,the surface height distribution is translated into a phase distribution of the deformed grating in this paper a new approach is purposed to demodulate the phase simply,fast but effectively and translate it into the surface height information.It needs only sample instrument and is insensitive to the noise,so very useful to test the object in-line.

关 键 词：三维面形测量 投影光栅 测量 

分 类 号：TH740.1[机械工程—光学工程]