一种新结构自愈式高储能密度脉冲电容器的实验研究  

Experimental Study on a New Structure Self-healing High Energy Density Pulse Capacitor

作　　者：王科[1] 杨兰均[1] 张乔根[1] 许继业 金玲 

机构地区：[1]西安交通大学电气工程学院,陕西西安710049 [2]西安电力电容器厂,陕西西安710082

出　　处：《高压电器》2005年第6期445-448,共4页High Voltage Apparatus

摘　　要：研制了一种金属化膜脉冲电容器。通过采用内串结构、选择合适的金属膜方阻值,提高了电容器的储能密度。而通过改变金属膜方阻值的大小以及对电极端部的加厚处理进行改进,在保持其储能密度一定的情况下,有效延长了电容器的使用寿命。寿命试验表明,单个元件喷金层的脱落是造成电容器失效及寿命缩短的主要原因,而外层薄膜自愈严重及其中轴处的横贯内外层的自愈是造成单支元件电容量下降的主要原因。A sort of metallized polypropylene pulse capacitor has been designed and two ways are introduced to increase the energy density of the capacitor： adopting inner series structure, choosing appropriate metallized film, ohm/sq. For prolonging the life of the metallized film is adjusted and the metallized film electrode rim is thickened more. The life test results reveal that the reason of the capacitor＇s destroying can be confirmed to the breaking off of one element＇s sprayed end, while the elements＇ capacitance drop is due to the serious self-healing of the elements＇ outer layer film and the entire self-healing of the metallized film middle interspace.

关 键 词：脉冲电容器 自愈 内串结构 方阻值 

分 类 号：TM531.2[电气工程—电器]