导线线圈的射线层析检测  

X-ray Computed Tomography on Conducting Windings

作　　者：杨宝刚[1] 李建伟[2] 任华友[1] 金虎[1] 

机构地区：[1]航天材料及工艺研究所,北京100076 [2]中国航空综合技术研究所,北京100028

出　　处：《CT理论与应用研究（中英文）》2005年第1期33-36,共4页Computerized Tomography Theory and Applications

摘　　要：本文选用不同的方法对两个导线线圈进行了射线检测,主要采用透射式工业CT检测和康普顿背散射成像检测两种射线层析检测方法,有效检测了导线线圈内部的缺陷情况,并指出射线层析检测作为一项新技术和新手段,可充分应用在航天产品的无损检测中。Some X-ray testing methods were used on conducting windings. The transmitting computed tomography and Compton back scattering tomography were used especially. The defects of conducting windings were tested effectively. By the way, it proved that the X-ray computed tomography can be used effectively in the non-destructive testing of aerospace products.

关 键 词：导线线圈 射线层析检测 透射式工业CT检测 康普顿背散射成像 

分 类 号：TP274.4[自动化与计算机技术—检测技术与自动化装置]