Bi系多芯丝超导带材的超导性能与微观组织分析  

ANALYSIS OF PROPERTY AND MICROSTRUCTURE IN BI-2223 MULTIFILAMENT TAPES

作　　者：郑会玲[1] 徐晓燕[1] 熊晓梅[1] 王庆阳[1] 郝清滨[1] 梁明[1] 马荣超[1] 郑俊涛[1] 刘奉生[1] 于泽铭[1] 李成山[1] 纪平[1] 卢亚锋[1] 张平祥[1] 周廉[1] 

机构地区：[1]西北有色金属研究院超导所,陕西西安710016

出　　处：《低温物理学报》2005年第A01期728-731,共4页Low Temperature Physical Letters

基　　金：国家"863"计划(2003AA306120)资助项目~~

摘　　要：本文采用XRD和SEM技术分析了具有不同临界电流密度（Jc）的Bi系多芯超导带材．结果表明，样品中Bi-2223晶粒高度取向排列，其取向因子F值在0．947-0．977范围内．SEM分析结果发现，高Jc样品中在平行于带材平面的片状的Bi-2223晶粒的晶界处残留的杂质主要为CuO晶粒，它与Bi-2223晶体结合紧密．在低Jc的样品中，Bi-2223晶片边界存在的杂质颗粒尺寸较大，其成分为（St，Ca）CuO和CuO的混合体．样品的横断面和纵断面的SEM观察发现，在高性能的样品中，芯丝烧结体的致密度较高．枝条状Bi-2223晶体穿过银层，在芯丝之间形成了很强的连接体．本文讨论了临界电流密度与微观组织的关系．Three Bi-2223 multifilament tapes have been studied by XRD and SEM. XRD analysis reveals the high texture of Bi-2223 phases being in all tapes. Their Lotgering factor （F2223） is in a range of 0.947-0.977. SEM micrographs of the surface structure of the etched tape have shown that the secondary phases CuO and the mixture of （Sr,Ca）CuO and CuO are distributed at Bi-2223 grain boundaries. SEM analysis of the cross section and longitudinal section shows that the high mass density of oxide core is in the tape with high Jc. Outgrowth formation of Bi-2223 is observed in all tapes. The role of the microstructure with respect to the critical current densities is discussed in the paper.

关 键 词：BI-2223带材 微观结构 临界电流密度 

分 类 号：O511.2[理学—低温物理]