采用EPR谱和TEM对YSZ单晶辐照损伤的研究  

Study on irradiation damage of yttria-stabilized zirconia single crystals using EPR and TEM

作　　者：祖小涛[1] 封向东[2] 雷雨[1] 朱莎 王鲁闵 

机构地区：[1]电子科技大学应用物理系,四川成都610054 [2]四川大学物理系,四川成都610065 [3]美国密西根大学核工程与放射科学系,安娜堡mi48109

出　　处：《强激光与粒子束》2005年第12期1909-1912,共4页High Power Laser and Particle Beams

基　　金：国家自然科学基金委-中国工程物理研究院联合基金资助课题(10376006)

摘　　要：利用电子顺磁共振(EPR)谱和透射电子显微镜(TEM)研究了YSZ单晶的辐照效应。200 keV的Xe和400 keV的Cs离子注入[111]取向的YSZ单晶中,注量均为5×1016cm-2。EPR结果表明辐照产生了共振吸收位置g‖=1.989和g⊥=1.869、对称轴为[111]的六配位Zr3+顺磁缺陷。Cs辐照产生了比Xe离子辐照多约150倍的六配位Zr3+顺磁缺陷。两种样品的剖面电子显微分析表明没有发现非晶化转变,但是Cs离子辐照的样品在损伤集中区域产生了密度较高的缺陷。因此,EPR谱和电子显微观察均说明在相同离位损伤(约160 dpa)的情况下,Cs离子辐照比Xe离子辐照产生了更多的缺陷。造成这一现象的原因是Cs离子是化学活性的而Xe离子却是惰性的。Electron paramagnetic resonance（EPR） and cross-sectional transmission electron microscopy were used to study defect structure and radiated damage mechanism. Single crystal samples of cubic zirconia stabilized by 9.5 mol. % Y2O3 （YSZ） were implanted with 200 keV Xe ions and 400 keV Cs ions up to a dose of 5 × 1016 cm^-2 , respectively. EPR spectra show the trigonal signal with g 1 = 1. 989 and g⊥= 1. 869, which exhibites axial symmetry with [111] direction as symmetry axis composed of sixfold-coordinated Zr^3＋ sites. Peak-to-peak intensity （per unit volume） of Cs-ion irradiated YSZ is as about 150 time as that of Xe-ion irradiated YSZ, which indicates that the concentration of sixfold-coordinated Zr^3＋ defects produced by Cs-ion irradiation is far more than that of Xe-ion irradiated. The cross-sectional images of the irradiated samples show that the Cs-ion irradiation in YSZ produced more defect clusters than Xe-ion irradiation.

关 键 词：YSZ单晶 离子辐照 辐照缺陷 电子顺磁共振谱 透射电子显微镜 

分 类 号：TQ174.4[化学工程—陶瓷工业] O433.4[化学工程—硅酸盐工业]